Atomic Force Microscope Construction and Gratings Contour Measurement.

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Measurement of friction coefficients with the atomic force microscope

A new axial method for measuring the friction coefficient with the atomic force microscope is given. This axial method requires no calibration steps and is performed simultaneously with a normal force measurement by measuring the difference between the constant compliance slopes of the extend and retract force curves. The algorithm can be applied retrospectively to extract the friction coeffici...

متن کامل

Force Spectroscopy with the Atomic Force Microscope

Introduction and Review Atomic Force Microscope (AFM) Spectroscopy is an AFM based technique to measure, and sometimes control the polarity and strength of the interaction between the AFM tip and the sample. Although the tip-sample interaction may be studied in terms of the energy, the quantity that is measured first is always the tip-sample force, and thus the nomenclature: force spectroscopy....

متن کامل

Force-feedback High-speed Atomic Force Microscope

High-speed atomic force microscopy (HSAFM) has enabled researchers to view the nanometer-scale dynamic behavior of individual biological and bio-relevant molecules at a molecular-level resolution under physiologically relevant time scales, which is the realization of a dream in life sciences. These high-speed imaging applications now extend to the cellular/bacterial systems with the use of a sm...

متن کامل

Scanned-cantilever atomic force microscope

We have developed a 3.6 pm scan range atomic force microscope that scans the cantilever instead of the sample, while the optical-lever detection apparatus remains stationary. The design permits simpler, more adaptable sample mounting, and generally improves ease of use. Software workarounds alleviate the minor effects of spurious signal variations that arise as a result of scanning the cantilev...

متن کامل

Print your atomic force microscope.

Progress in scanning probe microscopy profited from a flourishing multitude of new instrument designs, which lead to novel imaging modes and as a consequence to innovative microscopes. Often these designs were hampered by the restrictions, which conventional milling techniques impose. Modern rapid prototyping techniques, where layer by layer is added to the growing piece either by light driven ...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Journal of the Japan Society for Precision Engineering

سال: 1991

ISSN: 1882-675X,0912-0289

DOI: 10.2493/jjspe.57.1615